The Collection of
Computer Science Bibliographies

TECS Bibliography of Testing Embedded-Core Based System Chips

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Number of references:314Last update:September 8, 2005
Number of online publications:0Supported:yes
Most recent reference:2005

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Information on the Bibliography

Author:
Erik Jan Marinissen <Erik . Jan . Marinissen @ philips . com> (email mangled to prevent spamming)
Philips Research Laboratories
VLSI Design Automation & Test
Prof. Holstlaan 4 - WAY 4.083
5656 AA Eindhoven
The Netherlands
Abstract:
The TECS Bibliography contains references to publications in the field of (1) manufacturing test and (2) design validation and debug of embedded-core based system chips.
Keywords:
IC (integrated circuit); embedded core; manufacturing test; design validation; debug
Author Comments:
References to general test and debug techniques, i.e., not in particular related to the topic of embedded cores and/or system chips, are NOT included.

Browsing the bibliography

Bibliographic Statistics

Types:
inproceedings(248), article(46), misc(8), mastersthesis(6), phdthesis(3), book(2), manual(1)
Fields:
title(314), author(312), year(309), month(301), pages(279), booktitle(248), address(241), volume(50), journal(46), publisher(45), number(38), editor(11), howpublished(9), school(9), series(9), note(3), isbn(1), organization(1)
Distribution of publication dates:
Distribution of publication dates

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